Our complete DFT design platform to help customers test cost reduction and test quality improvement.
Provide customized DFT services according to customer demand.
IEEE 1686 iJTAG
IEEE 1149.1 boundary scan
Memory BIST
Scan compression
On-chip clock controller insertion
Test point insertion
Core wrapper insertion
Share_bus Memory Bist
Memory repair
Memory bist diagnose
Memory bist soft_programe
IDDQ
MissionMode：IST/Lbist/Mbist
3rd-party IP bist test: loopback
Partition-good or Downgrading
